Correction Prediction: Reducing Error Correction Latency for On-Chip Memories

被引:0
|
作者
Duwe, Henry [1 ]
Jian, Xun [1 ]
Kumar, Rakesh [1 ]
机构
[1] Univ Illinois, Champaign, IL 61820 USA
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The reliability of on-chip memories (e.g., caches) determines their minimum operating voltage (V-min) and, therefore, the power these memories consume. A strong error correction mechanism can be used to tolerate the increasing memory cell failure rate as supply voltage is reduced. However, strong error correction often incurs a high latency relative to the on-chip memory access time. We propose correction prediction where a fast mechanism predicts the result of strong error correction to hide the long latency of correction. Subsequent pipeline stages execute using the predicted values while the long latency strong error correction attempts to verify the correctness of the predicted values in parallel. We present a simple correction prediction implementation, CP, which uses a fast, but weak error correction mechanism as the correction predictor. Our evaluations for a 32KB 4-way set associative SRAM L1 cache show that the proposed implementation, CP, reduces the average cache access latency by 38%-52% compared to using a strong error correction scheme alone. This reduces the energy of a 2-issue in-order core by 16%-21%.
引用
收藏
页码:463 / 475
页数:13
相关论文
共 50 条
  • [1] A Unified Framework for Error Correction in On-Chip Memories
    Sala, Frederic
    Duwe, Henry
    Dolecek, Lara
    Kumar, Rakesh
    [J]. 2016 46TH ANNUAL IEEE/IFIP INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS WORKSHOPS (DSN-W), 2016, : 268 - 274
  • [2] THE RELIABILITY OF SEMICONDUCTOR RAM MEMORIES WITH ON-CHIP ERROR-CORRECTION CODING
    GOODMAN, RM
    SAYANO, M
    [J]. IEEE TRANSACTIONS ON INFORMATION THEORY, 1991, 37 (03) : 884 - 896
  • [3] Timing error correction techniques for voltage-scalable on-chip memories
    Karl, E
    Sylvester, D
    Blaauw, D
    [J]. 2005 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), VOLS 1-6, CONFERENCE PROCEEDINGS, 2005, : 3563 - 3566
  • [4] A STATIC RAM CHIP WITH ON-CHIP ERROR CORRECTION
    CHIUEH, TD
    GOODMAN, RM
    SAYANO, M
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (05) : 1290 - 1294
  • [5] Design of on-chip error correction systems for multilevel NOR and NAND flash memories
    Sun, F.
    Devarajan, S.
    Rose, K.
    Zhang, T.
    [J]. IET CIRCUITS DEVICES & SYSTEMS, 2007, 1 (03) : 241 - 249
  • [6] ENDURANCE OF EEPROMS WITH ON-CHIP ERROR CORRECTION
    HAIFLEY, T
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 1987, 36 (02) : 222 - 223
  • [7] CALCULATE THE MTBF OF EEPROMS WITH ON-CHIP ERROR CORRECTION
    SWEETMAN, D
    [J]. ELECTRONIC DESIGN, 1988, 36 (03) : 95 - 96
  • [8] Chip-Independent Error Correction in Main Memories
    Manoochehri, Mehrtash
    Dubois, Michel
    [J]. PROCEEDINGS INTERNATIONAL CONFERENCE ON EMBEDDED COMPUTER SYSTEMS - ARCHITECTURES, MODELING AND SIMULATION (SAMOS XV), 2015, : 181 - 188
  • [9] Error Correction Encoding for Tightly Coupled On-Chip Buses
    Karmarkar, Kedar
    Tragoudas, Spyros
    [J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2014, 22 (12) : 2571 - 2584
  • [10] On-chip triple-error correction and quadruple-error detection ECC structure for ultra-large, single-chip memories
    Alzahrani, FM
    Chen, T
    [J]. COMPUTERS & ELECTRICAL ENGINEERING, 2000, 26 (05) : 317 - 335