A comparative study of pseudo stuck-at and leakage fault model

被引：1

作者：

Zachariah, ST ^{[1
]}

Chakravarty, S ^{[1
]}

机构：

[1] SUNY Buffalo, Dept Comp Engn & Sci, Buffalo, NY 14260 USA

来源：

TWELFTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS | 1999年

关键词：

D O I：

10.1109/ICVD.1999.745130

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I-DDQ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.

引用

页码：91 / 94

页数：4

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