Stress, hydration, and optical absorption in ion-implanted aluminum oxide

被引:1
|
作者
Arnold, GW [1 ]
机构
[1] Consultants Int, Tijeras, NM 87059 USA
关键词
Al2O3; ion implantation; stress; hydration; O-vacancy production;
D O I
10.1016/S0921-5093(98)00711-4
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The surface stress induced by energetic implants (Ar, Xe) promotes ambient hydration (max. similar to 1 at.%) into Al2O3 for collisional deposition energies of 10(21)-10(22) keV cm(-3). Al implants are anomalous in that they induce hydration above 10(21) keV cm(-3) that rises near-linearly with no saturation at the highest deposition levels (similar to 10(24) keV cm(-3)). Both Al and H produce anomalously large F-centre concentrations; stress measurements show near-coincidence behaviour reflecting their influence on O-vacancy production. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:71 / 77
页数:7
相关论文
共 50 条
  • [41] ELECTROCHEMICAL INVESTIGATIONS OF ION-IMPLANTED OXIDE-FILMS
    SCHULTZE, JW
    DANZFUSS, B
    MEYER, O
    STIMMING, U
    MATERIALS SCIENCE AND ENGINEERING, 1985, 69 (02): : 273 - 282
  • [42] Tribological properties of ion-implanted polyphenylene oxide (PPO)
    San, JF
    Liu, JJ
    Zhu, BL
    Liu, ZM
    Dong, C
    Zhang, QY
    WEAR, 2001, 251 (PART 2) : 1504 - 1510
  • [43] Dielectric Function of Native Oxide on Ion-Implanted GaAs
    Kulik, M.
    Rzodkiewicz, W.
    Gluba, L.
    Kobzev, A. P.
    ACTA PHYSICA POLONICA A, 2013, 123 (05) : 956 - 959
  • [44] ELECTROCATALYTIC PROPERTIES OF ION-IMPLANTED OXIDE-FILMS
    ELFENTHAL, L
    PATZELT, T
    SCHULTZE, JW
    MEYER, O
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 116 : 71 - 77
  • [45] CHARACTERIZATION OF BLISTER FORMATION AND PITTING OF TUNGSTEN ION-IMPLANTED ALUMINUM
    SMITH, PP
    BUCHANAN, RA
    WILLIAMS, JM
    SCRIPTA METALLURGICA ET MATERIALIA, 1995, 32 (12): : 2015 - 2020
  • [46] RADIATION-DAMAGE AND ANNEALING STUDIES OF ION-IMPLANTED ALUMINUM
    BUONAQUISTI, AD
    COLLINS, RA
    DEARNALEY, G
    RADIATION EFFECTS LETTERS, 1981, 67 (1-2): : 43 - 48
  • [47] SURFACE-CHARGE CONSIDERATIONS IN THE PITTING OF ION-IMPLANTED ALUMINUM
    NATISHAN, PM
    MCCAFFERTY, E
    HUBLER, GK
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (02) : 321 - 327
  • [48] ELECTRON TRAPPING BEHAVIOR OF SILICON DIOXIDE WITH ION-IMPLANTED ALUMINUM
    YOUNG, DR
    JOURNAL OF ELECTRONIC MATERIALS, 1976, 5 (04) : 441 - 441
  • [49] OPTICAL MEASUREMENT OF THE DISTRIBUTION OF DAMAGE IN ION-IMPLANTED GAAS
    KRAISINGDECHA, P
    SHWE, C
    GAL, M
    TAN, HH
    JAGADISH, C
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1994, 9 (08) : 1489 - 1492
  • [50] ELECTRON TRAPPING BEHAVIOR OF SILICON DIOXIDE WITH ION-IMPLANTED ALUMINUM
    YOUNG, DR
    DIMARIA, DJ
    HUNTER, WR
    JOURNAL OF ELECTRONIC MATERIALS, 1977, 6 (05) : 569 - 579