Single-electron thermal devices coupled to a mesoscopic gate

被引:43
|
作者
Sanchez, Rafael [1 ]
Thierschmann, Holger [2 ]
Molenkamp, Laurens W. [3 ]
机构
[1] Univ Carlos III Madrid, Inst Gregorio Millan, E-28911 Madrid, Spain
[2] Delft Univ Technol, Fac Appl Sci, Kavli Inst Nanosci, Lorentzweg 1, NL-2628 CJ Delft, Netherlands
[3] Univ Wurzburg, Phys Inst, Expt Phys 3, D-97074 Wurzburg, Germany
来源
NEW JOURNAL OF PHYSICS | 2017年 / 19卷
基金
欧洲研究理事会;
关键词
quantum dot; heat currents; thermal devices; single-electron tunneling; COULOMB-BLOCKADE OSCILLATIONS; HEAT-CONDUCTION; QUANTUM-DOT; ENERGY; THERMOPOWER; REFRIGERATION;
D O I
10.1088/1367-2630/aa8b94
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We theoretically investigate the propagation of heat currents in a three-terminal quantum dot engine. Electron-electron interactions introduce state-dependent processes which can be resolved by energy-dependent tunneling rates. We identify the relevant transitions which define the operation of the system as a thermal transistor or a thermal diode. In the former case, thermal-induced charge fluctuations in the gate dot modify the thermal currents in the conductor with suppressed heat injection, resulting in huge amplification factors and the possible gating with arbitrarily low energy cost. In the latter case, enhanced correlations of the state-selective tunneling transitions redistribute heat flows giving high rectification coefficients and the unexpected cooling of one conductor terminal by heating the other one. We propose quantum dot arrays as a possible way to achieve the extreme tunneling asymmetries required for the different operations.
引用
收藏
页数:13
相关论文
共 50 条
  • [41] Single-electron transistors based on gate-induced Si island for single-electron logic application
    Kim, DH
    Sung, SK
    Kim, KR
    Lee, JD
    Park, BG
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2002, 1 (04) : 170 - 175
  • [42] Fundamental experiments on single-electron devices:: quantum fluctuations of charge on strongly coupled islands
    Schäfer, R
    Limbach, B
    vom Stein, PV
    Wallisser, C
    NANOFAIR 2004 NEW IDEAS FOR INDUSTRY, 2004, 1839 : 183 - 183
  • [43] SINUSOIDAL GATE VOLTAGES FOR A 3-GATE SINGLE-ELECTRON PUMP
    FUKUSHIMA, A
    IWASA, A
    YOSHIHIRO, K
    KINOSHITA, J
    ENDO, T
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) : 561 - 563
  • [44] Single-common-gate triple-dot single-electron devices with side gate capacitances larger than the central one
    Imai, Shigeru
    Moriguchi, Shin-ichi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2014, 53 (09)
  • [45] Single-electron pumping in common-gate triple-dot devices with arbitrary asymmetric gate capacitance distributions
    Shigeru Imai
    Reon Takanoya
    Journal of Computational Electronics, 2020, 19 : 1494 - 1506
  • [46] Thermal Conductance of a Single-Electron Transistor
    Dutta, B.
    Peltonen, J. T.
    Antonenko, D. S.
    Meschke, M.
    Skvortsov, M. A.
    Kubala, B.
    Koenig, J.
    Winkelmann, C. B.
    Courtois, H.
    Pekola, J. P.
    PHYSICAL REVIEW LETTERS, 2017, 119 (07)
  • [47] Advanced techniques for silicon single-electron devices
    Takahashi, Y
    Ono, Y
    Fujiwara, A
    Shiraishi, K
    Nagase, M
    Horiguchi, S
    Murase, K
    EXPERIMENTAL IMPLEMENTATION OF QUANTUM COMPUTATION, 2001, : 183 - 188
  • [48] MINIATURE ELECTRICAL FILTERS FOR SINGLE-ELECTRON DEVICES
    VION, D
    ORFILA, PF
    JOYEZ, P
    ESTEVE, D
    DEVORET, MH
    JOURNAL OF APPLIED PHYSICS, 1995, 77 (06) : 2519 - 2524
  • [49] Single-electron pumping in common-gate triple-dot devices with arbitrary asymmetric gate capacitance distributions
    Imai, Shigeru
    Takanoya, Reon
    JOURNAL OF COMPUTATIONAL ELECTRONICS, 2020, 19 (04) : 1494 - 1506