Quantum Sensing High-precision metrology based on the peculiarities of the subatomic realm

被引:0
|
作者
Ratti, Carlo
机构
关键词
D O I
暂无
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:43 / 43
页数:1
相关论文
共 50 条
  • [11] High-precision two-dimensional displacement metrology based on matrix metasurface
    Zang, Haofeng
    Zhang, Zhiyu
    Huang, Zuotang
    Lu, Yonghua
    Wang, Pei
    SCIENCE ADVANCES, 2024, 10 (02)
  • [12] A high-precision measurement technique for evaluating alcohol concentrations using an optical metrology system based on a position sensing detector
    Yeh, Yen-Liang
    Wang, Cheng Chi
    Jang, Ming-Jyi
    Lin, Yen-Pin
    OPTICS AND LASERS IN ENGINEERING, 2009, 47 (05) : 599 - 603
  • [13] High-precision synchronous phasor measurement based on compressed sensing
    Yu H.-N.
    Du Y.
    Guo S.-X.
    Jilin Daxue Xuebao (Gongxueban)/Journal of Jilin University (Engineering and Technology Edition), 2018, 48 (01): : 312 - 318
  • [14] High-precision wavelength-flexible frequency division for metrology
    Gross, P
    Boller, KJ
    Klein, ME
    PHYSICAL REVIEW A, 2005, 71 (04):
  • [15] Oscillating-magnetic-field effects in high-precision metrology
    Gan, H. C. J.
    Maslennikov, G.
    Tseng, K-W
    Tan, T. R.
    Kaewuam, R.
    Arnold, K. J.
    Matsukevich, D.
    Barrett, M. D.
    PHYSICAL REVIEW A, 2018, 98 (03)
  • [16] High-precision triangulation sensing of mirror surface
    Mikhlyaev, SV
    OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN 2001), 2001, 4416 : 400 - 403
  • [17] Multiple-sensor integration for rapid and high-precision coordinate metrology
    Shen, TS
    Huang, JB
    Menq, CH
    IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2000, 5 (02) : 110 - 121
  • [18] Error sources, measurement uncertainties and calibration techniques in high-precision metrology
    Bitte, F
    Mischo, H
    Pfeifer, T
    PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2, 1999, : 427 - 430
  • [19] SDSS-V focal plane system high-precision metrology
    Engelman, Michael
    O'Brien, Thomas P.
    Pogge, Richard W.
    Derwent, Mark
    Sayres, Conor
    Pappalardo, Daniel
    Brandon, Christopher
    Shover, Jonathan
    Ramirez, Solange
    Wachter, Stefanie
    GROUND-BASED AND AIRBORNE INSTRUMENTATION FOR ASTRONOMY IX, 2022, 12184
  • [20] Development of a high-precision surface metrology system and its uncertainty analysis
    Kuo, SK
    Yang, WH
    Lin, CC
    Yeh, KM
    Tsai, MJ
    Hung, CC
    2005 IEEE INTERNATIONAL CONFERENCE ON MECHATRONICS, 2005, : 945 - 952