共 50 条
- [23] Erratum to: Determination of the Electrical Resistivity of Vertically Aligned Carbon Nanotubes by Scanning Probe Microscopy [J]. Technical Physics, 2021, 66 : 1168 - 1168
- [24] Scanning tunneling microscopy and spectroscopy of carbon nanotubes [J]. CARBON NANOTUBES: FROM BASIC RESEARCH TO NANOTECHNOLOGY, 2006, 222 : 19 - 42
- [25] Conductivity and surface potential studies in carbon films by conductive scanning probe microscopy [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (6 B): : 3728 - 3731
- [26] Conductivity and surface potential studies in carbon films by conductive scanning probe microscopy [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (6B): : 3728 - 3731
- [28] Carbon nanotube probe for scanning tunneling microscopy [J]. INTERNATIONAL JOURNAL OF NANOSCIENCE, VOL 4, NO 4, 2005, 4 (04): : 437 - 441
- [29] Combination of scanning probe microscopy techniques for evaluating the electrical parameters of individual multiwalled carbon nanotubes [J]. SCANNING PROBE MICROSCOPY 2017 (SPM-2017), 2017, 256