Scanning probe microscopy studies of carbon nanotubes

被引:0
|
作者
Odom, TW
Hafner, JH
Lieber, CM
机构
[1] Harvard Univ, Dept Chem, Cambridge, MA 02138 USA
[2] Harvard Univ, Div Engn & Appl Sci, Cambridge, MA 02138 USA
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中图分类号
O59 [应用物理学];
学科分类号
摘要
This paper summarizes scanning probe microscopy investigations of the properties and manipulation of carbon nanotubes, and moreover, the fabrication and utilization of nanotubes as novel tips for probe microscopy experiments. First, scanning tunneling microscopy and spectroscopy measurements that elucidate (1) the basic relationship between Single-Walled Carbon Nanotube (SWNT) atomic structure and electronic properties, (2) the one-dimensional band structure of nanotubes, (3) localized structures in SWNTs, and (4) the electronic behavior of finite-size SWNTs are discussed. Second, atomic force microscopy investigations of the manipulation of nanotubes on surfaces to obtain information about nanotube-surface interactions and nanotube mechanical properties, and to create nanotube device structures are reviewed. Lastly, the fabrication, properties and application of carbon nanotube probe microscopy tips to ultrahigh resolution and chemically sensitive imaging are summarized. Prospects for future research are discussed.
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页码:173 / 211
页数:39
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