Validating Foundry Technologies for Extended Mission Profiles

被引：4
|
作者：
van Dijk, K. [1 ]
Volf, P. A. J. [1 ]
Detcheverry, C. [1 ]
Yau, A. [2 ]
Ngan, P. [3 ]
Liang, Z. [1 ]
Kuper, F. G. [1 ,4 ]
机构：
[1] NXP Semicond, Nijmegen, Netherlands
[2] TSMC, Taipei, Taiwan
[3] NXP Semicond, San Jose, Costa Rica
[4] Univ Twente, POB 217, NL-7500 AE Enschede, Netherlands
来源：
2010 INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM | 2010年
关键词：
qualification strategy; HTOL; ppm level; test screens; guard band; SRAM Vddmin;
D O I：
10.1109/IRPS.2010.5488845
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a process qualification and characterization strategy that can extend the foundry process reliability potential to meet specific automotive mission profile requirements. In this case study, data and analyses are provided that lead to sufficient confidence for pushing the allowed mission profile envelope of a process towards more aggressive (automotive) applications.
引用
收藏
页码：111 / 116
页数：6
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