Technological and design constraints for multilevel flash memories

被引:0
|
作者
Calligaro, C
Manstretta, A
Modelli, A
Torelli, G
机构
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses basic constraints for multilevel storage in Flash memories. Aspects such as programming algorithms, threshold voltage distribution, data retention, read disturbs, sense amplifier sensitivity and cell transconduttance spread are considered. Experimental results and design considerations are provided. Guidelines for the evaluation of multilevel storage feasibility are given. The feasibility of four-level storage with present technologies using a read voltage around 6 V is demonstrated.
引用
收藏
页码:1005 / 1008
页数:4
相关论文
共 50 条
  • [31] Codes for Asymmetric Limited-Magnitude Errors With Application to Multilevel Flash Memories
    Cassuto, Yuval
    Schwartz, Moshe
    Bohossian, Vasken
    Bruck, Jehoshua
    [J]. IEEE TRANSACTIONS ON INFORMATION THEORY, 2010, 56 (04) : 1582 - 1595
  • [32] Evaluation of design for reliability techniques in embedded flash memories
    Godard, Benoit
    Daga, Jean-Michel
    Torres, Lionel
    Sassatelli, Gilles
    [J]. 2007 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3, 2007, : 1593 - +
  • [33] A Radiation Hardened by Design Charge Pump for Flash Memories
    Bellotti, Giovanni
    Liberali, Valentino
    Stabile, Alberto
    Gregori, Stefano
    [J]. 2013 14TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2013,
  • [34] Performance of Multilevel Flash Memories With Different Binary Labelings: A Multi-User Perspective
    Huang, Pengfei
    Siegel, Paul H.
    Yaakobi, Eitan
    [J]. IEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONS, 2016, 34 (09) : 2336 - 2353
  • [35] A multipage cell architecture for high-speed programming multilevel NAND flash memories
    Takeuchi, K
    Tanaka, T
    Tanzawa, T
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (08) : 1228 - 1238
  • [36] A high-speed current-mode multilevel identifying circuit for flash memories
    Lin, HC
    Liang, F
    [J]. IEICE TRANSACTIONS ON ELECTRONICS, 2003, E86C (02): : 229 - 235
  • [37] High-speed low-power sense comparator for multilevel flash memories
    Pierin, A
    Gregori, S
    Khouri, O
    Micheloni, R
    Torelli, G
    [J]. ICECS 2000: 7TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS & SYSTEMS, VOLS I AND II, 2000, : 759 - 762
  • [38] ITERATIVE DESIGN PROCEDURE IN THE PRESENCE OF TECHNOLOGICAL CONSTRAINTS
    BALLIO, G
    CONTRO, R
    [J]. ADVANCES IN ENGINEERING SOFTWARE AND WORKSTATIONS, 1985, 7 (02): : 94 - 98
  • [39] On the Optimal Design of Steel Shells with Technological Constraints
    Turnic, Dragana
    Igic, Tomislav
    Zivkovic, Srdan
    Igic, Aleksandra
    Spasojevic Surdilovic, Marija
    [J]. APPLIED SCIENCES-BASEL, 2022, 12 (05):
  • [40] Design of a sense circuit for low-voltage flash memories
    Tanzawa, T
    Takano, Y
    Taura, T
    Atsumi, S
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2000, 35 (10) : 1415 - 1421