Testing systems on a chip

被引：68
|
作者：
Chandramouli, R [1 ]
Pateras, S [1 ]
机构：
[1] LOGICVIS INC, SYST BIST, SAN JOSE, CA USA
来源：
IEEE SPECTRUM | 1996年 / 33卷 / 11期
关键词：
D O I：
10.1109/6.542274
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
收藏
页码：42 / 47
页数：6
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