Testing the monster chip

被引：36

作者：

Zorian, Y ^{[1
]}

机构：

[1] Log Vis Inc, San Jose, CA USA

来源：

IEEE SPECTRUM | 1999年 / 36卷 / 07期

关键词：

Bandwidth - Built-in self test - Integrated circuit manufacture - Integrated circuit testing - Intellectual property - Mixer circuits - Performance - Random access storage - Transistors;

D O I：

10.1109/6.774966

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The semiconductor scaling trends of complexity, performance, and density have complicated the testing of 100-million-transistor chips. Overcoming these problems calls for a new approach to testing, where tests functions are partitioned basically into two complementary components used simultaneously: embedded test and external test. The balance of functions in each component depends on technological and economic factors.

引用

页码：54 / 60

页数：7

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