Morphological features of ferroparticles by atomic force microscopy

被引：0
|
作者：
Passaro, AMP [1 ]
Shibli, SM [1 ]
机构：
[1] Univ Sao Paulo, Inst Fis, BR-05315970 Sao Paulo, Brazil
来源：
ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION | 1998年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：513 / 514
页数：2
相关论文
共 50 条
  • [21] Investigation of sisal fibers by atomic force microscopy:: Morphological and adhesive characteristics
    Leite, F. L.
    Herrmann, P. S. P.
    Da Roz, A. L.
    Ferreira, F. C.
    Curvelo, A. A. S.
    Mattoso, L. H. C.
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2006, 6 (08) : 2354 - 2361
  • [22] Morphological characteristics of fulvic acid fractions observed by atomic force microscopy
    Yu, J.
    Xu, Q.
    Liu, Z.
    Guo, X.
    Han, S.
    Yuan, S.
    Tong, L.
    [J]. JOURNAL OF MICROSCOPY, 2013, 252 (01) : 71 - 78
  • [23] Morphological study of the healthy human oculomotor nerve by atomic force microscopy
    Melling, M
    Karimian-Teherani, D
    Behnam, M
    Mostler, S
    [J]. NEUROIMAGE, 2003, 20 (02) : 795 - 801
  • [24] CAN ATOMIC FORCE MICROSCOPY TIPS BE INSPECTED BY ATOMIC FORCE MICROSCOPY
    HELLEMANS, L
    WAEYAERT, K
    HENNAU, F
    STOCKMAN, L
    HEYVAERT, I
    VANHAESENDONCK, C
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1309 - 1312
  • [25] Atomic force Microscopy
    Perkel, JM
    [J]. SCIENTIST, 2006, 20 (07): : 68 - 68
  • [26] Distributions of Parameters and Features of Multiple Bond Ruptures in Force Spectroscopy by Atomic Force Microscopy
    Guo, Senli
    Li, Nan
    Lad, Nimit
    Desai, Shivam
    Akhremitchev, Boris B.
    [J]. JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (19): : 8755 - 8765
  • [27] Atomic Force Microscopy
    Bellon, Ludovic
    [J]. PHYSICS TODAY, 2020, 73 (05) : 57 - 58
  • [28] Atomic force microscopy
    Diaspro, A
    Rolandi, R
    [J]. IEEE ENGINEERING IN MEDICINE AND BIOLOGY MAGAZINE, 1997, 16 (02): : 26 - 27
  • [29] Atomic force microscopy
    Wright-Smith, C
    Smith, CM
    [J]. SCIENTIST, 2001, 15 (02): : 23 - 24
  • [30] Atomic force microscopy
    West, P
    Starostina, N
    [J]. ADVANCED MATERIALS & PROCESSES, 2004, 162 (02): : 35 - 37
12345