共 50 条
- [41] Modeling of vacancy flux due to stress-induced migration JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (04): : 1314 - 1317
- [43] Modeling of stress-induced leakage current in thin gate oxides 2002 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS, 2002, : 375 - 377
- [45] Modeling of suppressed shot noise in stress-induced leakage currents Noise and Fluctuations, 2005, 780 : 203 - 208
- [49] Thickness dependence of stress-induced leakage currents in silicon oxide IEEE Trans Electron Devices, 6 (993-1001):