Direct measurements and numerical simulations of gas charging in microelectromechanical system capacitive switches

被引:56
|
作者
Venkattraman, A. [1 ]
Garg, A. [2 ,3 ]
Peroulis, D. [2 ,3 ]
Alexeenko, A. A. [1 ,3 ]
机构
[1] Purdue Univ, Sch Aeronaut & Astronaut, W Lafayette, IN 47907 USA
[2] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
[3] Purdue Univ, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
关键词
BREAKDOWN; EMISSION;
D O I
10.1063/1.3688176
中图分类号
O59 [应用物理学];
学科分类号
摘要
Gas breakdown in microelectromechanical system capacitive switches is demonstrated using high resolution current measurements and by particle-in-cell/Monte Carlo collision (PIC/MCC) simulations. Measurements show an electric current through a 3 mu m air gap increasing exponentially with voltage, starting at 60 V. PIC/MCC simulations with Fowler-Nordheim [Proc. R. Soc. London, Ser. A 119, 173 (1928)] field emission reveal self-sustained discharges with significant ion enhancement and a positive space charge. The effective ion-enhanced field emission coefficient increases with voltage up to about 0.3 with an electron avalanche occurring at 159 V. The measurements and simulations demonstrate a charging mechanism for microswitches consistent with earlier observations of gas pressure and composition effects on lifetime. (C) 2012 American Institute of Physics. [doi:10.1063/1.3688176]
引用
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页数:4
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