Edge density characterization in the RFX-mod experiment using the ultrafast reflectometry technique

被引：11

作者：

De Masi, G. ^{[1
]}

Cavazzana, R. ^{[1
]}

Fassina, A. ^{[1
]}

Martines, E. ^{[1
]}

Momo, B. ^{[1
]}

Moresco, M. ^{[2
]}

机构：

[1] Assoc Euratom ENEA Fus, Consorzio RFX, I-35127 Padua, Italy

[2] Univ Padua, Dipartimento Ingn Elettr, I-35131 Padua, Italy

来源：

NUCLEAR FUSION | 2011年 / 51卷 / 05期

关键词：

BAND FREQUENCY-MODULATION; PROFILE MEASUREMENTS; MICROWAVE REFLECTOMETRY; SYSTEM;

D O I：

10.1088/0029-5515/51/5/053016

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

The traditional and widely used reflectometric schemes are not able to probe the edge density layers of the reversed field pinches (RFPs) due to the presence of a high level of density fluctuations. In order to overcome this limitation, an ultrafast microwave reflectometer has been developed and the first Ka-band has been successfully operational on the RFX-mod experiment [1] since mid-2009. The actual diagnostics configuration (frequency sweep 26.5-30.5 GHz in 1 mu s) allows us to evaluate the radial distance of the relative cut-off density layer with a high time resolution. The first results are presented and discussed in this paper. In particular, a relation between edge density and local magnetic topology is proposed as well as a systematic study of the average behaviour over several global operative conditions of the machine. An outlook on the future diagnostic developments is also given.

引用

页数：7

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