Edge density characterization in the RFX-mod experiment using the ultrafast reflectometry technique

被引:11
|
作者
De Masi, G. [1 ]
Cavazzana, R. [1 ]
Fassina, A. [1 ]
Martines, E. [1 ]
Momo, B. [1 ]
Moresco, M. [2 ]
机构
[1] Assoc Euratom ENEA Fus, Consorzio RFX, I-35127 Padua, Italy
[2] Univ Padua, Dipartimento Ingn Elettr, I-35131 Padua, Italy
关键词
BAND FREQUENCY-MODULATION; PROFILE MEASUREMENTS; MICROWAVE REFLECTOMETRY; SYSTEM;
D O I
10.1088/0029-5515/51/5/053016
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The traditional and widely used reflectometric schemes are not able to probe the edge density layers of the reversed field pinches (RFPs) due to the presence of a high level of density fluctuations. In order to overcome this limitation, an ultrafast microwave reflectometer has been developed and the first Ka-band has been successfully operational on the RFX-mod experiment [1] since mid-2009. The actual diagnostics configuration (frequency sweep 26.5-30.5 GHz in 1 mu s) allows us to evaluate the radial distance of the relative cut-off density layer with a high time resolution. The first results are presented and discussed in this paper. In particular, a relation between edge density and local magnetic topology is proposed as well as a systematic study of the average behaviour over several global operative conditions of the machine. An outlook on the future diagnostic developments is also given.
引用
收藏
页数:7
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