BAND FREQUENCY-MODULATION;
PROFILE MEASUREMENTS;
MICROWAVE REFLECTOMETRY;
SYSTEM;
D O I:
10.1088/0029-5515/51/5/053016
中图分类号:
O35 [流体力学];
O53 [等离子体物理学];
学科分类号:
070204 ;
080103 ;
080704 ;
摘要:
The traditional and widely used reflectometric schemes are not able to probe the edge density layers of the reversed field pinches (RFPs) due to the presence of a high level of density fluctuations. In order to overcome this limitation, an ultrafast microwave reflectometer has been developed and the first Ka-band has been successfully operational on the RFX-mod experiment [1] since mid-2009. The actual diagnostics configuration (frequency sweep 26.5-30.5 GHz in 1 mu s) allows us to evaluate the radial distance of the relative cut-off density layer with a high time resolution. The first results are presented and discussed in this paper. In particular, a relation between edge density and local magnetic topology is proposed as well as a systematic study of the average behaviour over several global operative conditions of the machine. An outlook on the future diagnostic developments is also given.