Effect of DC voltage on dielectric properties of low-voltage cable with XLPE insulation

被引：1
|
作者：
Zhang, XH [1 ]
Hu, QJ [1 ]
Gao, JG [1 ]
Liu, Y [1 ]
机构：
[1] Harbin Univ Sci & Technol, Inst Elect & Elect Engn, Harbin 150040, Peoples R China
来源：
PROCEEDINGS OF THE 2005 INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATING MATERIALS, VOLS, 1-3 | 2005年
关键词：
D O I：
10.1109/ISEIM.2005.193446
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The microstructures of a XLPE cable sample in service for one year (sample-A) and a fresh XLPE cable sample (sample-B), which were applied high electrical stress in order to initiate electrical tree, were observed by means of scan electronic microscope (SEM) and optic microscopy. It is found that the electrical trees in sample-A are longer in length and more in dimensionality than those of sample-B. Some special traces appear in SEM image of sample-A, which are thought to be additive crystallite separating from polymer under high electrical stress. Dielectric loss tangent (tan delta) of sample-A at 110(i) is higher 30% than that of sample-B. However phenomenon of insulation resistance of sample-A falling did not be observed in the test, which is different from the monitoring results of sample-A in service.
引用
收藏
页码：624 / 627
页数：4
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