Impact of oxygen ambient on ferroelectric properties of polar-axis-oriented CaBi4Ti4O15 films

被引:21
|
作者
Kato, K [1 ]
Tanaka, K
Suzuki, K
Kimura, T
Nishizawa, K
Miki, T
机构
[1] Natl Inst Adv Ind Sci & Technol, Moriyama Ku, 2266-98 Anagahora, Nagoya, Aichi 4638560, Japan
[2] Nagoya Inst Technol, Showa Ku, Nagoya, Aichi 4668555, Japan
关键词
D O I
10.1063/1.1883329
中图分类号
O59 [应用物理学];
学科分类号
摘要
Polar-axis oriented CaBi4Ti4O15 (CBTi144) films were fabricated on Pt foils using a complex metal alkoxide solution. The oxygen ambient during crystallization of the films impacted the crystal perfection, crystallite size, and the ferroelectric properties. The 500 mm thick film crystallized in oxygen flow had single columnar structure and in-plane grain size of about 200 nm. The Scherrer's crystallite diameter was calculated as about 110 nm. The ferroelectric properties were improved. The Pr and Ec of the film enhanced as 33.6 mu C/cm(2) and 357 kV/cm, respectively, at an applied voltage of 50 V. Voltage applied for full polarization switching was lowered by controlling oxygen stoichiometry of the film. Indeed, the polar-axis-oriented CBTi144 films would open up possibilities for devices as Pb-free ferroelectric materials. (C) 2005 American Institute of Physics.
引用
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页码:1 / 3
页数:3
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