Impact of oxygen ambient on ferroelectric properties of polar-axis-oriented CaBi4Ti4O15 films

被引:21
|
作者
Kato, K [1 ]
Tanaka, K
Suzuki, K
Kimura, T
Nishizawa, K
Miki, T
机构
[1] Natl Inst Adv Ind Sci & Technol, Moriyama Ku, 2266-98 Anagahora, Nagoya, Aichi 4638560, Japan
[2] Nagoya Inst Technol, Showa Ku, Nagoya, Aichi 4668555, Japan
关键词
D O I
10.1063/1.1883329
中图分类号
O59 [应用物理学];
学科分类号
摘要
Polar-axis oriented CaBi4Ti4O15 (CBTi144) films were fabricated on Pt foils using a complex metal alkoxide solution. The oxygen ambient during crystallization of the films impacted the crystal perfection, crystallite size, and the ferroelectric properties. The 500 mm thick film crystallized in oxygen flow had single columnar structure and in-plane grain size of about 200 nm. The Scherrer's crystallite diameter was calculated as about 110 nm. The ferroelectric properties were improved. The Pr and Ec of the film enhanced as 33.6 mu C/cm(2) and 357 kV/cm, respectively, at an applied voltage of 50 V. Voltage applied for full polarization switching was lowered by controlling oxygen stoichiometry of the film. Indeed, the polar-axis-oriented CBTi144 films would open up possibilities for devices as Pb-free ferroelectric materials. (C) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
相关论文
共 50 条
  • [1] High piezoelectric response in polar-axis-oriented CaBi4Ti4O15 ferroelectric thin films
    Fu, DS
    Suzuki, K
    Kato, K
    APPLIED PHYSICS LETTERS, 2004, 85 (16) : 3519 - 3521
  • [2] Ferro- and piezoelectric properties of polar-axis-oriented CaBi4Ti4O15 films
    Kato, K
    Fu, DS
    Suzuki, K
    Tanaka, K
    Nishizawa, K
    Miki, T
    APPLIED PHYSICS LETTERS, 2004, 84 (19) : 3771 - 3773
  • [3] Structure and piezoelectric properties of 1-μm-thick polar-axis-oriented CaBi4Ti4O15 films
    Kato, K.
    Tanaka, K.
    Suzuki, K.
    Masuda, Y.
    Kimura, T.
    Nishizawa, K.
    Miki, T.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2007, 87 (04): : 637 - 640
  • [4] Structure and piezoelectric properties of 1-μm-thick polar-axis-oriented CaBi4Ti4O15 films
    K. Kato
    K. Tanaka
    S. Kayukawa
    K. Suzuki
    Y. Masuda
    T. Kimura
    K. Nishizawa
    T. Miki
    Applied Physics A, 2007, 87 : 637 - 640
  • [5] Ferro- and piezoelectric properties of CaBi4Ti4O15 films with polar axis orientation
    Kato, K
    Suzuki, K
    Fu, D
    Tanaka, K
    Nishizawa, K
    Miki, T
    INTEGRATED FERROELECTRICS, 2005, 69 : 143 - 149
  • [6] Effects of La doping on ferroelectric properties of CaBi4Ti4O15 thin films
    Ding, Yanxia
    Hu, Guangda
    Fan, Suhua
    SURFACE REVIEW AND LETTERS, 2007, 14 (02) : 277 - 281
  • [7] Polarization switching in CaBi4Ti4O15 ferroelectric thin films
    Fu, DS
    Suzuki, K
    Kato, K
    ELECTROCERAMICS IN JAPAN VII, 2004, 269 : 41 - 44
  • [8] ORIENTATION DEPENDENCE OF FERROELECTRIC AND DIELECTRIC PROPERTIES IN CaBi4Ti4O15 THIN FILMS
    Do, D.
    Kim, S. S.
    Kim, J. W.
    Lee, Y. I.
    Bhalla, A. S.
    INTEGRATED FERROELECTRICS, 2009, 105 : 99 - 106
  • [9] Ferroelectric and piezoelectric properties of tungsten doped CaBi4Ti4O15 ceramics
    Jiangtao Zeng
    Ying Wang
    Yongxiang Li
    Qunbao Yang
    Qingrui Yin
    Journal of Electroceramics, 2008, 21 : 305 - 308
  • [10] Ferroelectric and piezoelectric properties of tungsten doped CaBi4Ti4O15 ceramics
    Zeng, Jiangtao
    Wang, Ying
    Li, Yongxiang
    Yang, Qunbao
    Yin, Qingrui
    JOURNAL OF ELECTROCERAMICS, 2008, 21 (1-4) : 305 - 308