Realization of a spectral radiance responsivity scale with a laser-based source and Si radiance meters

被引:15
|
作者
Eppeldauer, GP [1 ]
Brown, SW [1 ]
Larason, TC [1 ]
Rácz, M [1 ]
Lykke, KR [1 ]
机构
[1] Natl Inst Stand & Technol, Opt Technol Div, Gaithersburg, MD 20899 USA
关键词
D O I
10.1088/0026-1394/37/5/41
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A spectral radiance responsivity (SRR) scale derived from the spectral irradiance responsivity scale has been realized on the newly developed NIST facility for Spectral Irradiance and Radiance Responsivity Calibrations with Uniform Sources (SIRCUS). The scales were directly derived from the primary standard cryogenic radiometer using transfer standard irradiance trap detectors and laser-based uniform sources. Silicon radiance meters of standards quality have been developed to hold the SRR scale. The radiance meters were characterized and optimized fur size-of-source effects. The optimized meters were calibrated for SRR against the monochromatic uniform source. In addition to the SIRCUS calibrations, preliminary tests were also made on the Spectral Comparator Facility (SCF) of the NIST. These relative SRR tests were made in both imaging and non-imaging measurement modes. The results of the different SRR calibrations are compared and evaluated.
引用
收藏
页码:531 / 534
页数:4
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