A novel nonlinear statistical modeling technique for microwave devices

被引：0

作者：

Swidzinski, JF ^{[1
]}

Chang, K ^{[1
]}

机构：

[1] Texas A&M Univ, Dept Elect Engn, College Stn, TX 77843 USA

来源：

2000 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 | 2000年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A Novel nonlinear methodology for representing statistical variations of FET Equivalent Circuit Parameters (ECPs) and a new approach to yield estimation are presented. Proposed statistical nonlinear characterization is based on combination of applied multivariate methods with heuristic techniques, while proposed yield estimation method is based on Latin Hypercube Sampling (LHS). Practical examples validate the accuracy and efficiency of the methods.

引用

页码：887 / 890

页数：4

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