Efficient Statistical Simulation of Microwave Devices Via Stochastic Testing-Based Circuit Equivalents of Nonlinear Components

被引：42

作者：

Manfredi, Paolo ^{[1
]}

Canavero, Flavio G. ^{[2
]}

机构：

[1] Univ Ghent, Dept Informat Technol, Electromagnet Grp, B-9000 Ghent, Belgium

[2] Politecn Torino, Electromagnet Compatibil Grp, Dept Elect & Telecommun, I-10129 Turin, Italy

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2015年 / 63卷 / 05期

关键词：

Circuit simulation; microwave circuits; nonlinear circuits; polynomial chaos (PC); power amplifiers; SPICE; statistical analysis; tolerance analysis; uncertainty; POLYNOMIAL-CHAOS; VARIABILITY ANALYSIS; YIELD ESTIMATION; UNCERTAINTY; SYSTEMS;

D O I：

10.1109/TMTT.2015.2417855

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper delivers a considerable improvement in the framework of the statistical simulation of highly nonlinear devices via polynomial chaos-based circuit equivalents. Specifically, a far more efficient and "black-box" approach is proposed that reduces the model complexity for nonlinear components. Based on recent literature, the "stochastic testing" method is used in place of a Galerkin approach to find the pertinent circuit equivalents. The technique is demonstrated via the statistical analysis of a low-noise power amplifier and its features in terms of accuracy and efficiency are highlighted.

引用

页码：1502 / 1511

页数：10

共 13 条

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