1.1 kV vertical p-i-n GaN-on-sapphire diodes

被引:0
|
作者
Harrison, Sara E. [1 ]
Shao, Qinghui [1 ]
Frye, Clint D. [1 ]
Voss, Lars F. [1 ]
Nikolic, Rebecca J. [1 ]
机构
[1] Lawrence Livermore Natl Lab, 7000 East Avef, Livermore, CA 94550 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页数:2
相关论文
共 50 条
  • [1] Thermal Characterization of GaN Vertical p-i-n Diodes
    Dallas, J.
    Pavlidis, G.
    Chatterjee, B.
    Lundh, J. S.
    Jig, M.
    Kim, J.
    Kao, T.
    Detchprohm, T.
    Dupuis, R. D.
    Shen, S.
    Graham, S.
    Choi, S.
    [J]. PROCEEDINGS OF THE SIXTEENTH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS ITHERM 2017, 2017, : 328 - 333
  • [2] Avalanche Ruggedness of GaN p-i-n Diodes Grown on Sapphire Substrate
    Liu, Wenkai
    Xu, Weizong
    Zhou, Dong
    Ren, Fangfang
    Chen, Dunjun
    Yu, Peng
    Zhang, Rong
    Zheng, Youdou
    Lu, Hai
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2018, 215 (18):
  • [3] Fully Vertical GaN p-i-n Diodes Using GaN-on-Si Epilayers
    Zou, Xinbo
    Zhang, Xu
    Lu, Xing
    Tang, Chak Wah
    Lau, Kei May
    [J]. IEEE ELECTRON DEVICE LETTERS, 2016, 37 (05) : 636 - 639
  • [4] DLTS Analyses of GaN p-i-n Diodes Grown on Conventional and Patterned Sapphire Substrates
    Wang, Wei-Ju
    Liao, Chien-Lan
    Chang, Yung-Fu
    Lee, Yueh-Lin
    Ho, Chong-Long
    Wu, Meng-Chyi
    [J]. IEEE ELECTRON DEVICE LETTERS, 2013, 34 (11) : 1376 - 1378
  • [5] 1.1-kV Vertical GaN p-n Diodes With p-GaN Regrown by Molecular Beam Epitaxy
    Hu, Zongyang
    Nomoto, Kazuki
    Qi, Meng
    Li, Wenshen
    Zhu, Mingda
    Gao, Xiang
    Jena, Debdeep
    Xing, Huili Grace
    [J]. IEEE ELECTRON DEVICE LETTERS, 2017, 38 (08) : 1071 - 1074
  • [6] Performance and Breakdown Characteristics of Irradiated Vertical Power GaN P-i-N Diodes
    King, M. P.
    Armstrong, A. M.
    Dickerson, J. R.
    Vizkelethy, G.
    Fleming, R. M.
    Campbell, J.
    Wampler, W. R.
    Kizilyalli, I. C.
    Bour, D. P.
    Aktas, O.
    Nie, H.
    Disney, D.
    Wierer, J.
    Allerman, A. A.
    Moseley, M. W.
    Leonard, F.
    Talin, A. A.
    Kaplar, R. J.
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 62 (06) : 2912 - 2918
  • [7] Enhanced Energy Resolution of GaN-on-Sapphire p-i-n Alpha-Particle Detector With Isoelectronic Al-Doped i-GaN Layer
    Geng, Xinlei
    Xia, Xiaochuan
    Cui, Xingzhu
    Huang, Huishi
    Liang, Xiaohua
    Yan, Dawei
    Tian, Kuikui
    Chen, Leilei
    Yan, Xiaohong
    Long, Ze
    Niu, Mengchen
    Meng, Xiangcheng
    Liang, Hongwei
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 68 (08) : 2301 - 2308
  • [8] Forward leakage currents in GaN p-i-n diodes
    Lu, Ao
    Pan, Xiaofei
    Zhou, Xinjie
    Li, Yang
    Wang, Xiao
    Ao, Jinping
    Yan, Dawei
    [J]. SOLID-STATE ELECTRONICS, 2024, 217
  • [9] Switching performance of quasi-vertical GaN-based p-i-n diodes on Si
    Zhang, Xu
    Zou, Xinbo
    Tang, Chak Wah
    Lau, Kei May
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2017, 214 (08):
  • [10] Forward Conduction Instability of Quasi-Vertical GaN p-i-n Diodes on Si Substrates
    Zhang, Yuliang
    Zhang, Xu
    Zhu, Min
    Chen, Jiaxiang
    Tang, Chak Wah
    Lau, Kei May
    Zou, Xinbo
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (10) : 3992 - 3998