Hot-carrier noise under degenerate conditions

被引：0
|
作者：
Tadyszak, P [1 ]
Cappy, A [1 ]
Danneville, F [1 ]
Reggiani, L [1 ]
Varani, L [1 ]
Rota, L [1 ]
机构：
[1] INST ELECT & MICROELECT NORD,CNRS,UMR 9929,DEPT HYPERFREQUENCES & SEMICOND,F-59652 VILLENEUVE DASCQ,FRANCE
来源：
HOT CARRIERS IN SEMICONDUCTORS | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：413 / 415
页数：3
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