Nanoindentation Creep Behavior of Single-Crystal Bi2Se3 Topological Insulator

被引:1
|
作者
Uzun, Utku [1 ,2 ]
Lamuta, Caterina [2 ]
Yetmez, Mehmet [3 ]
机构
[1] Tarsus Univ, Dept Aerosp Engn, TR-33400 Tarsus, Turkey
[2] Univ Iowa, Dept Mech Engn, Iowa City, IA 52242 USA
[3] Zonguldak Bulent Ecevit Univ, Dept Mech Engn, TR-67100 Zonguldak, Turkey
来源
关键词
activation volume; bismuth selenide; creep; single crystal; strain rate; strain rate sensitivity; STRAIN-RATE SENSITIVITY; HIGH-ENTROPY ALLOY; POWER-LAW CREEP; ACTIVATION VOLUME; ELASTIC-MODULUS; LOADING RATE; INDENTATION; ROOM; DEFORMATION; PARAMETERS;
D O I
10.1002/pssb.202100481
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A single-crystal Bi2Se3 topological insulator is fabricated using the Bridgman-Stockbarger method. The crystal structure and atomic lattice parameters are identified by X-ray diffraction analysis. The nanoindentation size effect on creep displacement, activation volume, and strain rate sensitivity (SRS) with different maximum holding loads between 1000 and 5000 mu N is investigated using depth-sensing nanoindentation. Furthermore, the effect of the loading rate on the steady-state creep displacement and SRS is analyzed and discussed. Results show Bi2Se3's low resistance to plastic deformation and a significant increase of creep displacement with increasing holding load and holding rate. Additionally, creep strain rate, activation volume, and SRS are also calculated from the secondary stage creep, and results are compared with those of other flexible electronic materials.
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收藏
页数:9
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