Analysis of ArcCHECK Diode Array Performance for ViewRay Quality Assurance

被引：0
|
作者：
Ellefson, S. [1 ,2 ]
Culberson, W. [1 ]
Bednarz, B. [1 ]
DeWerd, L. [1 ]
Bayouth, J.
机构：
[1] Univ Wisconsin, Dept Med Phys, Madison, WI 53706 USA
[2] Univ Wisconsin, Dept Human Oncol, Madison, WI USA
来源：
MEDICAL PHYSICS | 2015年 / 42卷 / 06期
关键词：
D O I：
10.1118/1.4925934
中图分类号：
R8 [特种医学]; R445 [影像诊断学];
学科分类号：
1002 ; 100207 ; 1009 ;
摘要：
引用
收藏
页码：3668 / 3668
页数：1
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