Microstresses in molybdenum nitride thin films deposited by reactive DC magnetron sputtering

被引:4
|
作者
Shen, YG [1 ]
机构
[1] City Univ Hong Kong, Dept MEEM, Kowloon, Hong Kong, Peoples R China
来源
关键词
microstress; molybdenum nitride; reactive magnetron sputtering; thin films;
D O I
10.4028/www.scientific.net/MSF.490-491.589
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:589 / 594
页数:6
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