Thermodynamic and morphological analysis of large silicon self-interstitial clusters using atomistic simulations

被引:4
|
作者
Chuang, Claire Y. [1 ]
Sattler, Andreas [2 ]
Sinno, Talid [1 ]
机构
[1] Univ Penn, Dept Chem & Biomol Engn, Philadelphia, PA 19104 USA
[2] Siltronic AG, D-81737 Munich, Germany
基金
美国国家科学基金会;
关键词
TRANSIENT ENHANCED DIFFUSION; SITU ELECTRON-IRRADIATION; CZOCHRALSKI-GROWN SILICON; 111 DISLOCATION LOOPS; OXYGEN PRECIPITATION; COMPUTER-SIMULATION; EXTENDED DEFECTS; POINT-DEFECTS; MICRODEFECT FORMATION; EXTRINSIC DEFECTS;
D O I
10.1063/1.4917049
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study computationally the formation of thermodynamics and morphology of silicon self-interstitial clusters using a suite of methods driven by a recent parameterization of the Tersoff empirical potential. Formation free energies and cluster capture zones are computed across a wide range of cluster sizes (2 < N-i < 150) and temperatures (0.65 < T/T-m < 1). Self-interstitial clusters above a critical size (N-i similar to 25) are found to exhibit complex morphological behavior in which clusters can assume either a variety of disordered, three-dimensional configurations, or one of two macroscopically distinct planar configurations. The latter correspond to the well-known Frank and perfect dislocation loops observed experimentally in ion-implanted silicon. The relative importance of the different cluster morphologies is a function of cluster size and temperature and is dictated by a balance between energetic and entropic forces. The competition between these thermodynamic forces produces a sharp transition between the three-dimensional and planar configurations, and represents a type of order-disorder transition. By contrast, the smaller state space available to smaller clusters restricts the diversity of possible structures and inhibits this morphological transition. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:11
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