Immunity measurements using strip transmission. lines and family of TEM cells

被引：0
|
作者：
Sathyamurthy, S [1 ]
机构：
[1] Combat Vehicles Res & Dev Estab, Madras 600054, Tamil Nadu, India
来源：
PROCEEDINGS OF THE 8TH INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE AND COMPATIBILITY | 2003年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Immunity measurements (both commercial and military testing) using basic strip transmission lines system and TEM family of cells / enclosures are surveyed in this paper. Measurement requirements and choice of test fixtures/jigs available are explained in brief. Frequency ranges, field-generating capabilities, techniques involved are briefly discussed w.r.t type of application areas. Operational difficulties in meeting test requirements are also discussed. Finally a comparison on device options versus performance objectives are brought out in this paper for three different requirements. Suggestions for various options / test configurations are indicated in light of recent revisions of standards on immunity testing requirements in EMI/EMC.
引用
收藏
页码：261 / 268
页数：8
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