Near-Field Scanning of Stochastic Fields Considering Reduction of Complexity

被引：0

作者：

Thomas, David W. P. ^{[1
]}

Baharuddin, Mohd H. ^{[1
]}

Smartt, Christopher ^{[1
]}

Gradoni, Gabriele ^{[1
]}

Tanner, Gregor ^{[1
]}

Creagh, Stephen ^{[1
]}

Doncov, Nebojsa ^{[2
]}

Haider, Michael ^{[3
]}

Russer, Johannes A. ^{[3
]}

机构：

[1] Univ Nottingham, Dept Elect & Elect Engn, Nottingham, England

[2] Univ Nis, Fac Elect Engn, Nish, Serbia

[3] Tech Univ Munich, Inst Nanoelect, Munich, Germany

来源：

2017 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE | 2017年

关键词：

near field scanning; radiated emission; printed circuit boards; time domain measurement; stochastic fields; EMISSION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Near-field scanning is an established technique for the efficient and accurate measurement of the radiated emissions from electronic equipment for EMC studies. Recently the use of two probes near-field has been developed for the measurement of field correlation for electronic equipment with many uncorrelated sources that essentially have a stochastic field distribution. The use of two probe scanning is however very time consuming and requires large computer resources. In this paper a study is made of the emissions from typical electronic devices to look at methods for reducing the complexity of measurement of stochastic fields.

引用

页数：6

共 50 条

[41] Scanning near-field cathodoluminescence investigations
Scanning J Scanning Microsc, 6 (433-435):
[42] PHOTOTHERMAL SCANNING NEAR-FIELD MICROSCOPY
STOPKA, M
OESTERSCHULZE, E
SCHULTE, J
KASSING, R
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 24 (1-3): : 226 - 228
[43] A scanning near-field optical microscope
Saratovskij Gosudarstvennyj, Technicheskij Univ, Saratov, Russia
Prib Tekh Eksp, 2 (140-143):
[44] Scanning near-field optical data contrast measurement: a tomographylike near-field reconstruction
Barchiesi, Dominique
APPLIED OPTICS, 2006, 45 (29) : 7597 - 7601
[45] Cloaked Near-Field Scanning Optical Microscope Tip for Noninvasive Near-Field Imaging
Alu, Andrea
Engheta, Nader
PHYSICAL REVIEW LETTERS, 2010, 105 (26)
[46] Near-field scattering of longitudinal fields
Bouhelier, A
Beversluis, MR
Novotny, L
APPLIED PHYSICS LETTERS, 2003, 82 (25) : 4596 - 4598
[47] Mapping the near fields of plasmonic nanoantennas by scattering-type scanning near-field optical microscopy
Neuman, Tomas
Alonso-Gonzalez, Pablo
Garcia-Etxarri, Aitzol
Schnell, Martin
Hillenbrand, Rainer
Aizpurua, Javier
LASER & PHOTONICS REVIEWS, 2015, 9 (06) : 637 - 649
[48] Simultaneous Measurement of Electric and Magnetic Fields With a Dual Probe for Efficient Near-Field Scanning
Shao, Weiheng
Fang, Wenxiao
Huang, Yun
Li, Guangwei
Wang, Lei
He, Zhiyuan
Shao, E.
Guo, Yuandong
En, Yunfei
Yao, Bin
IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 2019, 67 (04) : 2859 - 2864
[49] SPHERICAL EXPANSIONS OR TIME-DOMAIN ACOUSTIC FIELDS - APPLICATION TO NEAR-FIELD SCANNING
HANSEN, TB
JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1995, 98 (02): : 1204 - 1215
[50] Antenna-based near-field scanning optical microscopyAntenna-based near-field scanning optical microscopy
Hamann, HF
Testing, Reliability, and Application of Micro- and Nano-Material Systems III, 2005, 5766 : 126 - 133

← 1 2 3 4 5 →