Removing MMIC Outliers in Production Test Using Real-Time Principal Component Analysis

被引：0
|
作者：
Remillard, Grace [2 ]
Trantanella, Charles [1 ]
Megan, Michael [1 ]
机构：
[1] Custom MMIC, Chelmsford, MA 01824 USA
[2] Univ Massachusetts, Lowell, MA 01854 USA
来源：
MICROWAVE JOURNAL | 2019年 / 62卷 / 11期
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：66 / 80
页数：15
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