Diamond films have been deposited on titanium substrates by microwave plasma chemical vapour deposition using the bias enhanced nucleation procedure. In the first minutes of exposure to the plasma there is a strong roughening of the titanium surface and a reduction of the oxide layer. Interaction with the gas phase as well as dissolution of the oxygen in the bulk contribute to this reduction. After 30 min plasma treatment the oxygen concentration in the bulk is reduced down to 0.2-0.3% and an accelerated hydrogen dissolution, hydride formation and carburization follow. Analogously to silicon the nucleation density increases with biasing time accompanied by a rise in the biasing current. Surpassing an optimum duration of the biasing process deposition of graphitic carbon is enhanced. The nucleation layer determines the bonding at the interface even after a long diamond growth process resulting in a bad adhesion of the films for long biasing procedures.
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Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, TaiwanArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Chen, Y. C.
Zhong, X. Y.
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Argonne Natl Lab, Ctr Electron Microscopy, Argonne, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Zhong, X. Y.
Konicek, A. R.
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Univ Wisconsin, Dept Phys, Madison, WI 53706 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Konicek, A. R.
Grierson, D. S.
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Univ Wisconsin, Dept Engn Phys, Madison, WI 53706 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Grierson, D. S.
Tai, N. H.
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Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, TaiwanArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Tai, N. H.
Lin, I. N.
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Tamkang Univ, Dept Phys, Tamsui 251, TaiwanArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Lin, I. N.
Kabius, B.
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Argonne Natl Lab, Ctr Electron Microscopy, Argonne, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Kabius, B.
Hiller, J. M.
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Argonne Natl Lab, Ctr Electron Microscopy, Argonne, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Hiller, J. M.
Sumant, A. V.
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Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Sumant, A. V.
Carpick, R. W.
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Univ Penn, Dept Mech Engn & Appl Mech, Philadelphia, PA 19104 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Carpick, R. W.
Auciello, O.
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Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA