safety instrumented system;
critical fault diagnosis;
critical fault treatment;
Bayesian network;
Petri net;
PETRI NETS;
ELEMENTARY;
SIPHONS;
D O I:
10.1109/TLA.2011.5993727
中图分类号:
TP [自动化技术、计算机技术];
学科分类号:
0812 ;
摘要:
Safety Instrumented Systems (SIS) are designed to prevent and / or mitigate accidents, avoiding undesirable high potential risk scenarios, assuring protection of people's health, protecting the environment and saving costs of industrial equipment. The design of these systems require formal methods for ensuring the safety requirements, but according material published in this area, has not identified a consolidated procedure to match the task. This sense, this article introduces a formal method for diagnosis and treatment of critical faults based on Bayesian network (BN) and Petri net (PN). This approach considers diagnosis and treatment for each safety instrumented function (SIF) including hazard and operability (HAZOP) study in the equipment or system under control. It also uses BN and Behavioral Petri net (BPN) for diagnoses and decision-making and the PN for the synthesis, modeling and control to be implemented by Safety Programmable Logic Controller (PLC). An application example considering the diagnosis and treatment of critical faults is presented and illustrates the methodology proposed.
机构:
Moulay Ismail Univ, ENSAM, Marjane Ii, MoroccoMoulay Ismail Univ, ENSAM, Marjane Ii, Morocco
Mkhida, Abdelhak
Thiriet, Jean-Marc
论文数: 0引用数: 0
h-index: 0
机构:
Univ Grenoble 1, GIPSA Lab, Grenoble Images Parole Signal Automat UMR CNRS IN, F-38402 St Martin Dheres, FranceMoulay Ismail Univ, ENSAM, Marjane Ii, Morocco
Thiriet, Jean-Marc
Aubry, Jean-Francois
论文数: 0引用数: 0
h-index: 0
机构:
Nancy Univ, CNRS UMR 7039, INPL, CRAN, F-54516 Vandoeuvre Les Nancy, FranceMoulay Ismail Univ, ENSAM, Marjane Ii, Morocco