Simple technique for measurement of residual wedge angle of high optical quality transparent parallel plate

被引：18
|
作者：
Chatterjee, S [1 ]
机构：
[1] Govt India, Dept Atom Energy, Ctr Adv Technol, Indore 452013, India
来源：
OPTICAL ENGINEERING | 2003年 / 42卷 / 11期
关键词：
parallel plate; wedge angle; fizeau interferometer; multiple-beam interferometry; fizeau fringes; haidinger fringes;
D O I：
10.1117/1.1613961
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A general technique for determination of residual wedge angles of high optical quality parallel plates using a Fizeau interferometer is discussed. In this technique the parallel plate to be tested for degrees of parallelism is used to introduce angular tilt in the Fizeau fringes of an air cavity of a known wedge angle. The parallelism is calculated from the angular tilt of the fringes. The technique is most suitable for highly parallel transparent plates with very low residual wedge angles. (C) 2003 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码：3235 / 3238
页数：4
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