Transition of particle growth region in SiH4 RF discharges

被引:17
|
作者
Kawasaki, H [1 ]
Sakamoto, K [1 ]
Maeda, S [1 ]
Fukuzawa, T [1 ]
Shiratani, M [1 ]
Watanabe, Y [1 ]
机构
[1] Kyushu Univ, Grad Sch Informat Sci & Elect engn, Dept Elect Device Engn, Fukuoka 8128581, Japan
关键词
particle; particulate; dust; plasma CVD; processing plasma; RF discharge; RF plasma; silane; SiH2; absorption spectroscopy; laser light scattering;
D O I
10.1143/JJAP.37.5757
中图分类号
O59 [应用物理学];
学科分类号
摘要
The growth region of particles in SiH4 RF discharges is investigated with the parameters of pressure, SiH4 concentration and RF power. When the diffusion time tau(D) of SiH2 radicals (key species for fast particle nucleation) through their production region is longer than their reaction time tau(R) with SiH4 and sufficient SiH2 radicals are supplied, particles grow at, a high growth rate of greater than or similar to 10's nm/s localized only around the plasma/sheath (P/S) boundary near the RF electrode where the radicals are produced. Under this condition, neutral clusters (resulting from the polymerization reactions) react with each other many times before they diffuse out of the radical production region. Since the diffusion time of clusters through the radical production region increases with cluster size, large clusters tend to be localized there and grow further to sizes on the order of nm. With tau(R) > tau(D) and/or insufficient supply of SiH2 radicals, particles grow at a low rate of 1 nm/s and exist in the plasma bulk as well as around the P/S boundary. Such low growth rates suggest that negatively charged clusters are indispensable in order for particles to grow to above several nm in size.
引用
收藏
页码:5757 / 5762
页数:6
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