Stratified random sampling for power estimation

被引：23
|
作者：
Ding, CS [1 ]
Wu, Q
Hsieh, CT
Pedram, M
机构：
[1] Rockwell Semicond Syst, Newport Beach, CA 92660 USA
[2] Univ So Calif, Dept Elect Engn Syst, Los Angeles, CA 90089 USA
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1998年 / 17卷 / 06期
基金：
美国国家科学基金会;
关键词：
power modeling and estimation; sampling method; VLSI;
D O I：
10.1109/43.703828
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, we present new statistical sampling techniques for performing power estimation at the circuit level. These techniques first transform the power estimation problem to a survey sampling problem, and then apply stratified random sampling to improve the efficiency of sampling, The stratification is based on a low-cost predictor, such as the zero delay power estimate, We also propose a two-stage stratified sampling technique to handle very long initial sequences. Experimental results show that the efficiency of stratified random sampling and two-stage stratified sampling techniques are 3-10 times higher than that of simple random sampling and the Markov-based Monte Carlo simulation techniques.
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页码：465 / 471
页数：7
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