Mapping chemically heterogeneous polymer system using selective chemical reaction and tapping mode atomic force microscopy

被引：0
|
作者：
Raghavan, D [1 ]
Gu, X
VanLandingham, M
Nguyen, T
机构：
[1] Howard Univ, Dept Chem, Polymer Sci Div, Washington, DC 20059 USA
[2] Natl Inst Stand & Technol, Bldg & Fire Res Lab, Bldg Mat Div, Gaithersburg, MD 20899 USA
来源：
MACROMOLECULAR SYMPOSIA | 2001年 / 167卷
关键词：
D O I：
10.1002/1521-3900(200103)167:1<297::AID-MASY297>3.0.CO;2-2
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
The mapping of chemically heterogeneous regions in PEA/PS film was achieved by reacting the film in a low pH environment and analyzing; by AFM. In 70:30 blend, the domains were identified as PS rich regions and matrix as the PEA rich regions, based on AFM images, FTIR measurements, and chemical modification study. During the course of hydrolysis of PEA, pits were formed in isolated regions of the matrix, as characterized by AFM.
引用
收藏
页码：297 / 305
页数：9
相关论文
共 50 条
  • [21] Accurate force spectroscopy in tapping mode atomic force microscopy in liquids
    Xu, Xin
    Melcher, John
    Raman, Arvind
    [J]. PHYSICAL REVIEW B, 2010, 81 (03)
  • [22] Visualisation of bacterial behaviour using tapping-mode atomic force microscopy
    Gorham, N.
    Becker, T.
    Shiers, D. W.
    Watling, H. R.
    [J]. BIOHYDROMETALLURGY: A MEETING POINT BETWEEN MICROBIAL ECOLOGY, METAL RECOVERY PROCESSES AND ENVIRONMENTAL REMEDIATION, 2009, 71-73 : 341 - +
  • [23] Characterization of polyester degradation using tapping mode atomic force microscopy.
    Gu, X
    Raghavan, D
    Nguyen, T
    VanLandingham, M
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U350 - U350
  • [24] Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation
    Stark, RW
    Heckl, WM
    [J]. SURFACE SCIENCE, 2000, 457 (1-2) : 219 - 228
  • [25] Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping
    Jakob, Devon S.
    Li, Nengxu
    Zhou, Huanping
    Xu, Xiaoji G.
    [J]. SMALL, 2021, 17 (37)
  • [26] Self-oscillating tapping mode atomic force microscopy
    Manning, L
    Rogers, B
    Jones, M
    Adams, JD
    Fuste, JL
    Minne, SC
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (09): : 4220 - 4222
  • [27] Compositional mapping of chemically modified glassy carbon electrodes with tapping-mode scanning force microscopy
    Kiema, GK
    Kariuki, JK
    McDermott, MT
    [J]. FUNDAMENTAL AND APPLIED ASPECTS OF CHEMICALLY MODIFIED SURFACES, 1999, (235): : 280 - 289
  • [28] The role of adhesion in tapping-mode atomic force microscopy
    D. Sarid
    J.P. Hunt
    R.K. Workman
    X. Yao
    C.A. Peterson
    [J]. Applied Physics A, 1998, 66 : S283 - S286
  • [29] Molecular dynamics models of tapping mode atomic force microscopy
    Sun, Baishun
    Huo, Xuyang
    Tian, LiGuo
    Wang, Jiajia
    Song, Zhengxun
    Wang, Zuobin
    [J]. PHYSICA SCRIPTA, 2023, 98 (05)
  • [30] Tapping mode atomic force microscopy of the hyaluronan derivative, hylan A
    Cowman, MK
    Li, M
    Dyal, A
    Balazs, EA
    [J]. CARBOHYDRATE POLYMERS, 2000, 41 (03) : 229 - 235
12345