Influence of gamma-ray and neutron irradiation on injection characteristics of 4H-SiC pn structures

被引:8
|
作者
Strel'chuk, AM
Kalinina, EV
Konstantinov, AO
Hallen, A
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] ACREO, SE-16440 Kista, Sweden
[3] Royal Inst Technol, Dept Elect, SE-16440 Kista, Sweden
关键词
gamma-ray and neutron irradiation; recombination; lifetime; 4H-SiC; RECOMBINATION; JUNCTION;
D O I
10.4028/www.scientific.net/MSF.483-485.993
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effect of gamma-ray and neutron irradiation on recombination current, injection electroluminescense and the value of the lifetime of nonequilibrium carriers for 4H-SiC pn structures was investigated. The irradiation was carried out with gamma-ray (dose 5x10(6) rad) and 1 MeV neutrons in the doses range from 1.2x10(14) cm(-2) to 6.24x10(14) cm(-2). Neutron irradiation with a dose 1.2x10(14) cm(-2) increased the recombination current, decreased the lifetime for deep-level recombination in the space charge region and decreased the intensity of the edge injection electroluminescense (hv(max) approximate to 3.16 eV) by 1.5-2 orders of magnitude; the neutron irradiation with high dose (6.24x10(14) cm(-2)) resulted in increase of the recombination current up to 2 orders of magnitude and decrease of lifetime at least up to 2 orders of magnitude. Gamma-ray irradiation and annealing at temperatures in the range 350-650 K left the recombination current and lifetime practically unchanged.
引用
收藏
页码:993 / 996
页数:4
相关论文
共 50 条
  • [1] Gamma-ray radiation effect on Ni/4H-SiC SBD
    Zhang Lin
    Zhang Yi-Men
    Zhang Yu-Ming
    Han Chao
    Ma Yong-Ji
    ACTA PHYSICA SINICA, 2009, 58 (04) : 2737 - 2741
  • [2] Effect of gamma-ray irradiation on the device process-induced defects in 4H-SiC epilayers
    Miyazaki, T.
    Makino, T.
    Takeyama, A.
    Onoda, S.
    Ohshima, T.
    Tanaka, Y.
    Kandori, M.
    Yoshie, T.
    Hijikata, Y.
    SUPERLATTICES AND MICROSTRUCTURES, 2016, 99 : 197 - 201
  • [3] Effects of gamma-ray irradiation on material and electrical properties of AlN gate dielectric on 4H-SiC
    Zhu, Xiaogang
    Shen, Zhanwei
    Wang, Z. J.
    Liu, Zhengran
    Miao, Yuyang
    Yue, Shizhong
    Fu, Zhao
    Li, Zihao
    Zhang, Yuning
    Hong, Rongdun
    Wu, Shaoxiong
    Chen, Xiaping
    Cai, Jiafa
    Fu, Deyi
    Zhang, Feng
    NANOTECHNOLOGY, 2024, 35 (27)
  • [4] Variant of excess current in 4H-SiC pn structures
    Strel'chuk, Anatoly M.
    Kalinina, Evgenia V.
    Lebedev, Alexander A.
    Boricheva, Irina K.
    Pavshukov, Vladimir V.
    SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 : 859 - +
  • [5] Radition effect on Ti/4H-SiC SBD of gamma-ray, electrons and neutrons
    Zhang Lin
    Xiao Jian
    Qiu Yang-Zhang
    Cheng Hong-Liang
    ACTA PHYSICA SINICA, 2011, 60 (05)
  • [6] Effects of gamma-ray irradiation on electrical characteristics of 6H-SiC metal-oxide-semiconductor structures
    Yoshikawa, M.
    Takahashi, Y.
    Ohshima, T.
    Ohnishi, K.
    Itoh, H.
    Okumura, H.
    Nashiyama, I.
    Yoshida, S.
    Denshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory, 1998, 62 (10): : 39 - 47
  • [7] About the nature of recombination current in 4H-SiC pn structures
    Strel'chuk, A. M.
    Mashichev, A. V.
    Lebedev, A. A.
    Volkova, A. N.
    Zekentes, K.
    Silicon Carbide and Related Materials 2005, Pts 1 and 2, 2006, 527-529 : 1343 - 1346
  • [8] Effects of gamma-ray irradiation on the electrical characteristics of SiC metal-oxide-semiconductor structures
    Yoshikawa, M
    Ohshima, T
    Itoh, H
    Nashiyama, I
    Takahashi, Y
    Ohnishi, K
    Okumura, H
    Yoshida, S
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 1998, 81 (10): : 37 - 47
  • [9] Effects of gamma-ray irradiation on the electrical characteristics of SiC metal-oxide-semiconductor structures
    Yoshikawa, Masahito
    Ohshima, Takeshi
    Itoh, Hisayoshi
    Nashiyama, Isamu
    Takahashi, Yoshihiro
    Ohnishi, Kazunori
    Okumura, Hajime
    Yoshida, Sadafumi
    Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi), 1998, 81 (10): : 37 - 47
  • [10] Gamma-ray irradiation-induced mobility enhancement of 4H-SiC NMOSFETs with a Ba-silicate interface layer
    Muraoka, Kosuke
    Sezaki, Hiroshi
    Ishikawa, Seiji
    Maeda, Tomonori
    Makino, Takahiro
    Takeyama, Akinori
    Ohshima, Takeshi
    Kuroki, Shin-Ichiro
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2019, 58 (08)