Surface hydroxylation of display glass analyzed by time-of-flight secondary ion mass apectrometry

被引:0
|
作者
Ralph, Andrew [1 ]
Cushman, Cody [2 ]
Fisher, Landon [2 ]
Banerjee, Joy [3 ]
Smith, Nicholas [3 ]
Linford, Matthew [2 ]
机构
[1] Utah Valley Univ, Orem, UT USA
[2] Brigham Young Univ, Provo, UT 84602 USA
[3] Corning Inc, Corning, NY 14831 USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
32
引用
收藏
页数:1
相关论文
共 50 条
  • [31] Elements and organic substances analyzed with a time-of-flight secondary ion mass spectrometer in the internal limiting membrane of macular hole
    Kishikawa, Y
    Gong, H
    Kitaoka, T
    Amemiya, T
    Tozu, M
    Tsujino, I
    Hoshi, T
    Ohashi, Y
    INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE, 2003, 44 : U681 - U681
  • [32] Secondary ion mass spectrometry and time-of-flight secondary ion mass spectrometry study of impurity measurements in HgCdTe
    Price, Steve
    Wang, Larry
    Wang, Alice
    Ginwalla, Arwa
    Mowat, Ian
    JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (08) : 1106 - 1109
  • [33] Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
    Bertrand, P
    Weng, LT
    MIKROCHIMICA ACTA, 1996, : 167 - 182
  • [34] TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY OF POLYBUTADIENES
    HITTLE, LR
    HERCULES, DM
    SURFACE AND INTERFACE ANALYSIS, 1994, 21 (04) : 217 - 225
  • [35] Identification of human calculi with time-of-flight secondary ion mass spectrometry
    Ghumman, C. Amjad A.
    Carreira, Olga M. T.
    Moutinho, Augusto M. C.
    Tolstogouzov, Alexander
    Vassilenko, Valentina
    Teodoro, Orlando M. N. D.
    RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 2010, 24 (02) : 185 - 190
  • [36] Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe
    Steve Price
    Larry Wang
    Alice Wang
    Arwa Ginwalla
    Ian Mowat
    Journal of Electronic Materials, 2007, 36 : 1106 - 1109
  • [37] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF PERFLUORINATED POLYETHERS
    BLETSOS, IV
    HERCULES, DM
    FOWLER, D
    VANLEYEN, D
    BENNINGHOVEN, A
    ANALYTICAL CHEMISTRY, 1990, 62 (13) : 1275 - 1284
  • [38] MICROSCOPE IMAGING BY TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY
    SCHUELER, BW
    MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1992, 3 (2-3): : 119 - 139
  • [39] Pore confined time-of-flight secondary ion electrochemical mass spectrometry
    Wang, Jun-Gang
    Yu, Ru-Jia
    Hua, Xin
    Long, Yi-Tao
    CHEMICAL SOCIETY REVIEWS, 2023, 52 (08) : 2596 - 2616
  • [40] Lipid imaging with cluster time-of-flight secondary ion mass spectrometry
    Alain Brunelle
    Olivier Laprévote
    Analytical and Bioanalytical Chemistry, 2009, 393