Study on the performance of Cu foam with different porosity on SAC305 solder joints under ultrasonic-assisted soldering

被引:1
|
作者
Mao, Xin [1 ]
Zhang, Ruhua [1 ]
Yi, Xiong [1 ]
Hu, Xiaowu [1 ]
Li, Yulong [1 ]
Jiang, Xiongxin [1 ]
机构
[1] Nanchang Univ, Sch Mech Elect Engn, Nanchang 330031, Jiangxi, Peoples R China
基金
中国国家自然科学基金;
关键词
SN-PB SOLDER; MECHANICAL-PROPERTIES; FRACTURE-BEHAVIOR; INTERMETALLIC COMPOUNDS; INTERFACIAL REACTION; MICROSTRUCTURE; GROWTH; RELIABILITY; PARTICLES; PROPERTY;
D O I
10.1007/s10854-021-07186-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cu foams with 75% and 98% porosity were employed as reinforcing structures to enhance the performance of the Sn3.0Ag0.5Cu(SAC305)/Cu solder joints. The effects of Cu foam porosity and ultrasonic power on the microstructure and shear properties of solder joints were investigated. The results suggested that the Cu substrate produced excellent metallurgical reactions with both composite solder foils, but more Cu6Sn5 was generated in 75% porosity Cu foam/SAC305 solder joints. The increase of ultrasonic power would accelerate the dissolution of Cu skeleton and effectively refine and homogenize the intermetallic compound grains. Higher power ultrasonic vibration optimized the microstructure of the solder joint, so the shear strength of the joint was increased, but excessive ultrasonic power would cause microcracks at the interface of the solder joint in turn reducing the shear strength.
引用
收藏
页码:28108 / 28118
页数:11
相关论文
共 50 条
  • [41] Study on the Influence of Defects on Fracture Mechanical Behavior of Cu/SAC305/Cu Solder Joint
    Zhang, Sinan
    Wang, Zhen
    Wang, Jie
    Duan, Guihua
    Li, Haixia
    MATERIALS, 2022, 15 (14)
  • [42] Study on growth rate of interfacial metallic compound in SAC305/Cu joints
    Wang, Jianhua
    Meng, Gongge
    Sun, Fenglian
    Hanjie Xuebao/Transactions of the China Welding Institution, 2015, 36 (05): : 47 - 50
  • [43] Migration induced IMC formation in SAC305 solder joints on Cu, NiAu and NiP metal layers
    Meinshausen, L.
    Fremont, H.
    Weide-Zaage, K.
    MICROELECTRONICS RELIABILITY, 2012, 52 (9-10) : 1827 - 1832
  • [44] Effect of Extreme Environment on Interfacial IMC Growth and Fracture Behavior of SAC305/Cu solder joints
    Li, Zhigang
    Zhou, Xiangsheng
    Yang, Xiaofeng
    Fan, Wenqi
    Zheng, Kun
    2022 23RD INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2022,
  • [45] Interfacial Microstructure Evolution for Cu/Cu3Sn/Cu Solder Joints during Ultrasonic-Assisted TLP Soldering Process
    Han, Xu
    Li, Xiaoyan
    Yao, Peng
    Chen, Dalong
    2019 IEEE 21ST ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2019, : 355 - 359
  • [46] Microstructure and aging resistance of the joints between SAC305 solder and thermoelectric materials with different diffusion barriers
    Cheng, F. J.
    Ma, Z. L.
    Wang, Y.
    Zhang, G. X.
    Long, W. M.
    KOVOVE MATERIALY-METALLIC MATERIALS, 2014, 52 (03): : 157 - 162
  • [47] CHARACTERIZATION OF SAC305 SOLDER JOINTS UNDER ELEVATED CURRENT, TEMPERATURE, AND VARYING SHEAR STRESS CONDITIONS
    Ruby, Collin
    Huitink, David R.
    PROCEEDINGS OF ASME 2023 INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, INTERPACK2023, 2023,
  • [48] The fractal nature analysis by applying grain formations of SAC305/OSP Cu and SAC305-0.05Ni/OSP Cu solder joints for microelectronic packaging
    Mitic, Vojislav V.
    Fleshman, Collin
    Duh, Jenq-Gong
    Ilic, Ivana D.
    Lazovic, Goran
    MODERN PHYSICS LETTERS B, 2021, 35 (33):
  • [49] Effects of Joint Height on the Interfacial Microstructure and Mechanical Properties of Cu-Cored SAC305 Solder Joints
    Zongxiang Yao
    Shan Jiang
    Limeng Yin
    Diying Ling
    Zhongwen Zhang
    Liping Zhang
    Journal of Electronic Materials, 2020, 49 : 5391 - 5398
  • [50] Effects of accelerator in a copper plating bath on interfacial microstructure and mechanical properties of SAC305/Cu solder joints
    Xu, Han
    Zhang, Xudong
    Chen, Wenjing
    Zou, Minming
    Hu, Xiaowu
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2020, 31 (24) : 22810 - 22819