共 50 条
Doping in 2D
被引:5
|作者:
不详
机构:
关键词:
2;
D O I:
10.1038/s41928-021-00668-9
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Ion implantation can be used to dope silicon devices, but can be problematic when applied to the atomically thin crystal structure of two-dimensional materials — an increasing range of alternative methods is though available.
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页码:699 / 699
页数:1
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