When a thin glassy film is strained uniaxially, a shear deformation zone (SDZ) can be observed. The ratio of the thickness of the SDZ to that of the undeformed film is related to the maximum extension ratio, lambda, which depends on the entanglement molecular weight, M-e. We have measured lambda as a function of film thickness in strained freestanding films of polystyrene as a probe of M-e in confinement. It is found that thin films stretch further than thick films before failure, consistent with the interpretation that polymers in thin films are less entangled than bulk polymers, thus the effective value of M-e in thin films is significantly larger than that of the bulk. Our results are well described by a conceptually simple model based on the probability of finding intermolecular entanglements near an interface.
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Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
Johnson, Kyle J.
Glynos, Emmanouil
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Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USAUniv Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
Glynos, Emmanouil
Maroulas, Serafeim-Dionysios
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Univ Athens, Dept Chem, Athens 15771, GreeceUniv Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
Maroulas, Serafeim-Dionysios
Narayanan, Suresh
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Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USAUniv Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
Narayanan, Suresh
Sakellariou, Georgios
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Univ Athens, Dept Chem, Athens 15771, GreeceUniv Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
Sakellariou, Georgios
Green, Peter F.
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Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
Natl Renewable Energy Lab, Golden, CO 80401 USAUniv Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
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Division of Engineering and Applied Sciences, Harvard University, CambridgeDivision of Engineering and Applied Sciences, Harvard University, Cambridge
Xiang Y.
Tsui T.Y.
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Texas Instruments, Inc., DallasDivision of Engineering and Applied Sciences, Harvard University, Cambridge
Tsui T.Y.
Vlassak J.J.
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Division of Engineering and Applied Sciences, Harvard University, CambridgeDivision of Engineering and Applied Sciences, Harvard University, Cambridge