Technology breakthrough by ferroelectric HfO2 for low power logic and memory applications

被引:1
|
作者
Kobayashi, Masaharu [1 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Tokyo 1538505, Japan
关键词
D O I
10.1149/08602.0021ecst
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Internet-of-Things (IoT) edge device has been playing key roles as an intelligent sensor node device. The number of IoT devices will become trillions or even more, which requires low power and energy-efficient integrated device solutions. Ferroelectric HfO2 has been recently discovered and expected to open new paths for the integrated devices. In this paper, we introduce logic and memory applications: (1) Negative capacitance FET as a CMOS logic technology booster, (2) Nonvolatile SRAM as a power management tool, and (3) Ferroelectric tunnel junction as a novel analog memory for neuromorphic computing.
引用
收藏
页码:21 / 25
页数:5
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