Robust analysis of space-, time-, and energy-resolved soft x-ray measurements of magnetically confined fusion plasmas (invited)

被引:2
|
作者
VanMeter, P. D. [1 ,3 ]
Delgado-Aparicio, L. F. [2 ]
Reusch, L. M. [1 ,4 ]
Den Hartog, D. J. [1 ]
机构
[1] Univ Wisconsin Madison, Dept Phys, Madison, WI 53706 USA
[2] Princeton Plasma Phys Lab PPPL, Princeton, NJ 08540 USA
[3] Mayo Clin, Dept Radiol, Rochester, MN 55905 USA
[4] Edgewood Coll, Madison, WI 53711 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2021年 / 92卷 / 05期
关键词
REVERSED-FIELD-PINCH; TOMOGRAPHY; MODEL;
D O I
10.1063/5.0043787
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel compact multi-energy soft x-ray (ME-SXR) diagnostic based on the PILATUS3 100K x-ray detector has been developed in collaboration between the Princeton Plasma Physics Laboratory and the University of Wisconsin-Madison and tested on the Madison Symmetric Torus (MST) reversed-field pinch. This solid-state photon-counting detector consists of a two-dimensional array of similar to 100 000 pixels for which the lower photon absorption cutoff energy can be independently set, allowing it to be configured for a unique combination of simultaneous spatial, spectral, and temporal resolution of similar to 1 cm, 100 eV, and 500 Hz, respectively. The diagnostic is highly versatile and can be readily adapted to diverse plasma operating conditions and scientific needs without any required downtime. New results from improved-confinement and quasi-single helicity plasmas in the MST demonstrate how the detector can be applied to study multiple aspects of the evolution of magnetically confined fusion-grade plasmas. These include observing the evolution of thermal emissivity, characterizing the energy of mid-Z excitation lines, extracting the T-e profile, and observing the evolution of non-thermal populations. A technique for integrating the ME-SXR diagnostic into an integrated data analysis framework based on Bayesian inference is also presented. This allows ME-SXR measurements to be combined with data for complementary diagnostics in order to simultaneously infer T-e and n(Z) from all available information. Published under license by AIP Publishing.
引用
收藏
页数:9
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