Amplitude modulation atomic force microscopy based on higher flexural modes

被引：1
|
作者：
Zhou, Xilong [1 ,2 ]
Zhuo, Rongshu [1 ,2 ]
Wen, Pengfei [1 ,2 ]
Li, Faxin [3 ]
机构：
[1] Wuhan Univ Technol, Sch Sci, Dept Engn Struct & Mech, Wuhan 430070, Hubei, Peoples R China
[2] Wuhan Univ Technol, Hubei Key Lab Theory & Applicat Adv Mat Mech, Wuhan 430070, Hubei, Peoples R China
[3] Peking Univ, Coll Engn, Beijing 100871, Peoples R China
来源：
AIP ADVANCES | 2017年 / 7卷 / 12期
基金：
中国国家自然科学基金;
关键词：
TAPPING-MODE; ENERGY-DISSIPATION; VIBRATING TIP; PHASE-SHIFT; CONTACT; SURFACE; SYSTEM;
D O I：
10.1063/1.5004732
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
In this work, amplitude modulation atomic force microscopy (AM-AFM) based on the higher flexural modes of the microcantilever is investigated by a numerical approach. The amplitude-distance and phase-distance curves for the first four flexural modes are obtained and compared. The dependence of phase on elastic modulus and viscosity of the sample is analyzed. Results show that a higher flexural mode yields a larger amplitude and phase in the repulsive regime and reduces the bistability, but causes a larger sample deformation and peak repulsive force. Compared to that of a lower flexural mode, the phase of a higher flexural mode provides higher sensitivity to viscosity variation for relatively large moduli. (c) 2017 Author(s).
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页数：5
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