Lateral force modulation atomic force microscopy

被引：0
|
作者：
Yamanaka, K [1 ]
机构：
[1] Tohoku Univ, Grad Sch Engn, Dept Mat Proc, Aoba Ku, Sendai, Miyagi 9808579, Japan
来源：
JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS | 2001年 / 46卷 / 11期
关键词：
atomic force microscopy; modulation; friction; elasticity; stick slip;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：868 / 874
页数：7
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