Optical lithography technology

被引:0
|
作者
Magome, N
机构
关键词
optical lithography; g-line; i-line; KrF; ArF; excimer laser; stepper; scanner;
D O I
暂无
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Optical lithography technology for the recent progress from the g-line to the i-line and KrF steppers is reviewed taking into consideration three key factors in semiconductor manufacturing: pattern shrinkage, high integration and productivity. Then, issues relating to these three factors for 1G DRAMs are examined using a scanning exposure tool.
引用
收藏
页码:99 / 102
页数:4
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