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Determination of impurities in graphite using synchrotron radiation based X-ray fluorescence spectrometry

被引：5
|
作者：
Ghosh, M. [1 ,3 ]
Swain, K. K. [1 ,3 ]
Devi, P. S. Remya [1 ]
Chavan, T. A. [1 ]
Singh, A. K. [2 ]
Tiwari, M. K. [2 ]
Verma, R. [1 ]
机构：
[1] Bhabha Atom Res Ctr, Analyt Chem Div, Bombay, Maharashtra, India
[2] Raja Ramona Ctr Adv Technol, Synchrotrons Utilizat Sect, Indore, Madhya Pradesh, India
[3] Homi Bhabha Natl Inst, Bombay, Maharashtra, India
来源：
APPLIED RADIATION AND ISOTOPES | 2017年 / 128卷
关键词：
Graphite; Impurities; Synchrotron radiation; EDXRF; Internal standard method; ATOMIC EMISSION-SPECTROMETRY; HIGH-PURITY GRAPHITE; ACTIVATION-ANALYSIS; TRACE-ELEMENTS; LA;
D O I：
10.1016/j.apradiso.2017.07.025
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
Determination of impurities namely Ca, Mn, Fe, Ni, Zn, Sr and Pb in graphite by energy dispersive X-ray fluorescence spectrometry is described using microfocused synchrotron radiation. The internal standard and standard addition methodologies were adopted for quantification and the results were compared with tube based X-ray fluorescence spectrometry. Analysis of the results by the F and t-tests revealed their statistical equivalence. Synchrotron measurements improved the detection limits by an order of magnitude compared to the tube based technique. Cr and Zr, which were below the quantification limit in tube based technique, were also quantified by synchrotron based technique.
引用
收藏
页码：210 / 215
页数：6
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