Properties of X-ray Cherenkov radiation produced by charged particles in Si/Mo multilayers

被引：1
|
作者：
Aginian, M. A. [1 ]
Gevorgian, L. A. [1 ]
Ispirian, K. A. [1 ]
Ispiryan, M. K. [1 ]
机构：
[1] Yerevan Phys Inst, Bros Alikhanian 2, Yerevan 375036, Armenia
来源：
INTERNATIONAL CONFERENCE ON CHARGED AND NEUTRAL PARTICLES CHANNELING PHENOMENA II - CHANNELING 2006 | 2007年 / 6634卷
关键词：
Cherenkov radiation; transition radiation; X-ray mirrors;
D O I：
10.1117/12.741931
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The angular-spectral distributions as well as the dependence of the total number of photons of X-ray Cherenkov radiation upon the number, thickness of the layers and on particle energy have been calculated using the theoretical formulae taking into account the reflection from the interfaces between the two media of the Si/Mo multilayers. The possibilities of the experimental investigation have been discussed.
引用
收藏
页数：7
相关论文
共 50 条
  • [31] X-Ray Cherenkov Radiation in an Absorbing Medium with Finite Dimensions
    M. V. Bulgakova
    V. S. Malyshevsky
    G. V. Fomin
    Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2020, 14 : 264 - 266
  • [32] X-Ray Cherenkov Radiation in an Absorbing Medium with Finite Dimensions
    Bulgakova, M. V.
    Malyshevsky, V. S.
    Fomin, G. V.
    JOURNAL OF SURFACE INVESTIGATION, 2020, 14 (02): : 264 - 266
  • [33] Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques
    Maury, H.
    Jonnard, P.
    Andre, J.-M.
    Gautier, J.
    Bridou, F.
    Delmotte, F.
    Ravet, M.-F.
    SURFACE SCIENCE, 2007, 601 (11) : 2315 - 2322
  • [34] VAVILOV-CHERENKOV EFFECT AND BOHR RADIATION PRODUCED BY A BEAM OF CHARGED PARTICLES IN A DISPERSIVE MEDIUM
    NEUFELD, J
    WRIGHT, H
    PHYSICAL REVIEW, 1961, 124 (01): : 1 - &
  • [35] Structural analysis of a Mo/Si multilayered x-ray mirror by x-ray diffraction
    Kim, DE
    Cha, DH
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1996, 29 (01) : 74 - 78
  • [36] Irradiation Damage Test of Mo/Si, Ru/Si and Nb/Si Multilayers Using the Soft X-Ray Laser Built at QST
    Ichimaru, S.
    Ishino, M.
    Nishikino, M.
    Hatayama, M.
    Hasegawa, N.
    Kawachi, T.
    Maruyama, T.
    Inokuma, K.
    Zenba, M.
    Oku, S.
    X-RAY LASERS 2016, 2018, 202 : 303 - 308
  • [37] TARNISHING OF MO/SI MULTILAYER X-RAY MIRRORS
    UNDERWOOD, JH
    GULLIKSON, EM
    NGUYEN, K
    APPLIED OPTICS, 1993, 32 (34): : 6985 - 6990
  • [38] UV sub-ps laser pulse patterning of Mo/Si and W/Si multilayers for soft X-ray gratings
    Majkova, E
    Luby, S
    Chushkin, Y
    Jergel, M
    Papazoglou, D
    Manousaki, A
    Fotakis, C
    Zergioti, I
    Sobota, J
    ADVANCED LASER TECHNOLOGIES 2004, 2005, 5850 : 264 - 270
  • [39] Simulation study of total-electron-yield X-ray standing-wave spectra of Mo/SiC/Si/SiC and Mo/Si multilayers
    Ejima, T
    Muramatsu, Y
    Takenaka, H
    Watanabe, M
    SYNCHROTRON RADIATION INSTRUMENTATION, 2004, 705 : 1126 - 1129
  • [40] X-ray scattering study of interfacial roughness correlation in Mo/Si multilayers fabricated by ion beam sputtering
    Ulyanenkov, A
    Matsuo, R
    Omote, K
    Inaba, K
    Harada, J
    Ishino, M
    Nishii, M
    Yoda, O
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (10) : 7255 - 7260
12345