Promising complex ASIC design verification methodology

被引:0
|
作者
Assaf, Mansour H. [1 ,3 ]
Das, Sunil R. [2 ,3 ]
Hermas, Wael [3 ]
Jone, Wen-B. [4 ]
机构
[1] Univ Trinidad & Tobago, Omeara Campus, St Augustine, Trinidad Tobago
[2] Troy Univ, Dept Comp & Informat Sci, Montgomery, AL 36103 USA
[3] Univ Ottawa, Sch Informat Technol & Engn, Ottawa, ON KIN 6N5, Canada
[4] Univ Cincinnati, Dept Elect & Comp Engn, Comp Sci, Cincinnati, OH 45221 USA
基金
加拿大自然科学与工程研究理事会;
关键词
complex application-speck integrated circuits (ASICs); coverage-driven functional verification (CDV) and reuse methodology (RM); design under test (DUT); deterministic testing; intellectual property (IP) cores; random input generator; Verilog;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper aims at developing a design verification environment for complex application-specific integrated circuits (ASICs), with particular emphasis on embedded systems incorporating intellectual property (IP) cores. There exist methods to ensure correct design for IP core-based systems, but a promising approach to realize this is through the use of coverage-driven functional verification (CDV) and reuse methodology (RM). The CDV approach is based on the ASIC functionalities, and the verification process is accomplished in the early stages of the design. The use of functional coverage minimizes the number of test cases and thus enhances the verification process. The deterministic testing together with CDV and RM is applied to verify designs in the paper. The Specman e-language is used as a verification tool in the process since it incorporates the capabilities of both CDV and RM.
引用
收藏
页码:857 / +
页数:2
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